Toshiba MK6017MAP User Manual download pdf (Page 96)

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bit 4 (self-test implemented bit)

If this bit is cleared to zero, the device does not implement the Short and Extended self-test routines. If this

bit is set to one, the device implements the Short and Extended self-test routines. This bit is set to 1.

bits 5-7 (reserved).

This bit is set to 1

BYTE 368-369: SMART capability

bit 0 (power mode SMART data saving capabilities bit)

bit0 = 1 SMART data is saved before Power save mode changes.

bit0 = 0 SMART data is NOT saved before Power save mode changes.

This bit shall be set to 1

bit 1 (SMART data autosave after event capability bit)

This bit is fixed to 1

bit 2-15 Reserved

BYTE 370 Reserved

BYTE 372-373: Self-test routine recommended polling time

The self-test routine recommended polling time shall be equal to the number of minutes that is the minimum

recommended time before which the host should first poll for test completion status. Actual test time could

be several times this value. Polling before this time could extend the self-test execution time or abort the test

depending on the state of bit 2 of the off-line data capability bits.

BYTE 374-510: Reserved

BYTE 511: Data structure checksum

Checksum of the first 511 byte

1 2 ... 91 92 93 94 95 96 97 98 99 100 101 ... 125 126

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Toshiba MK6017MAP User Manual Page 96