Toshiba M40 User Manual download pdf (Page 101)

3.6 Memory Test 3 Diagnostic Programs

EQUIUM M40/M45/Satellite M40/M45 Maintenance

Manual 35

test coverage would be based on the setting and the value in ‘Percent (%)

mentioned at below.

Pattern Size: Choose the pattern size – BYTE, WORD, DWORD or ALL.

Percent (%): Choose the percentage of the defined range of the memory to

be tested.

Time Limit(h): Choose or Input the time (hour) of the defined range of the

memory to be tested.

Time Limit(m): Choose or Input the time (minute) of the defined range of

the memory to be tested.

1. Bit Stuck High Test

Data pattern: Every bit is ‘1’ (Each bit is high)

2. Bit Stuck Low Test

Data pattern: Every bit is ‘0'(Each bit is low);

3. Checker Board Test

Data pattern: Lo-byte and hi-byte are composed with 0101(0x5) and 1010

(0xA);

4. CAS Line Test

Data pattern: Lo-byte and hi-byte are composed with 0000 (0x0) and

1111(0xF);

5. Incremental Test

Data pattern: A series of increasing data from 0 by adding 1 each time;

6. Decrement Test

Data Pattern: A series of decreasing data from the maximum (e.g. 0xFFFF) by

subtracting 1 each time;

7. Incremental / Decrement Test

Data Pattern is a series of data whose low byte is increasing data from 0x00

and high byte is decreasing data from 0xFF.

Subtest 03 Extended Pattern

1 2 ... 96 97 98 99 100 101 102 103 104 105 106 ... 261 262

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Toshiba M40 User Manual Page 101